Service Type

Service Name

Service Description

(equipment, measurement ranges and accuracy, measurement techniques, etc.)

Estimated Contract Cost*, EUR

Surface

Relief (electron microscopy)

Study of the sample surface micro- and nanostructure by scanning electron microscopy

LEO 1455 VP scanning electron microscope: high-vacuum resolution for conductive samples of 3.5 nm. Linear dimensions of the topology elements of the microrelief of the surface of solid materials. Measurement technique - using scanning electron microscope. Measurements are carried out in accordance with ISO 16700:2016, GSI.

from 1 000

for a set of studies

Phase composition

Grain boundaries

Study of texture, phase composition, state of grain boundaries of materials using backscattered electron diffraction

HKL EBSD Premium System Channel 5 diffraction attachment for LEO 1455 VP scanning electron microscope: depth resolution of 5 nm; lateral resolution of 500 nm; angular resolution of 0.11 degrees; the time of obtaining one Kikuchi picture of not more than 1 s; the analyzed symmetry range of crystals includes all Laue groups.

Chemical composition

Determination of the qualitative and quantitative elemental composition of surface microsections by X-ray spectral microanalysis (analysis at a point, along an arbitrary line, over an arbitrary area, over an array of points)

Aztec Energy Advanced X-Max 80 energy-dispersive nitrogen-free spectrometer for LEO 1455 VP scanning electron microscope: range of elements – from Be to Pu; limits of measured concentrations – 0.1-100%; energy resolution for Mn Kα – 127 eV. Measurements are made using Oxford Instruments NanoAnalysis Aztec software version 2.2 in accordance with ISO 15632:2002.

Building of the chemical element distribution maps in the near-surface region of conductive materials

Film thickness

Determination of the thickness and composition of thin single-layer or multilayer films on the surface of bulk samples

Structure, phase composition, deformations, etc.

Raman and photoluminescence spectra measurement / mapping with high spatial resolution

NanoFinder HE (Lotis-TII) spectral-analytical complex: Measurement and mapping with submicron spatial resolution of the Raman and photoluminescence spectra, including in the temperature range from 25 to 800 K. Wavelengths of exciting radiation – 355, 473, 532 and 785 nm. Spectral resolution down to 0.01 nm (0.25 cm-1).

from 1 000

for a set of studies

Relief (probe microscopy)

Condensed-matter sample surface 3D-measurements of the linear dimensions of micro- and nanorelief structure elements by scanning probe microscopy with high spatial resolution

Solver P47 PRO scanning probe microscope: max. size of the scanning area of 100 µm (length) × 100 µm (width) × 2 µm (height); Z-axis resolution of 0.06 nm; lateral resolution of 0.2 nm. Various methods of measurements and influences can be implemented: tunneling microscopy, atomic force microscopy (contact and semi-contact), electric force microscopy (static and dynamic), magnetic force microscopy, rigidity / surface lateral forces measurement mode, nanolithography. Measurements are carried out in accordance with GSI Metric surface parameters. Method for performing measurements using a Solver P47 SPM is calibrated in accordance with GOST R 8.635 using a relief measure of the nanometer range, manufactured in accordance with GOST R 8.628 and verified in accordance with GOST R 8.629 or calibrated in accordance with GOST R 8.644; GOST R 8.700-2010.

from 1 000

for a set of studies

Determination of the main parameters of surface roughness with a height difference of up to 2 µm using scanning probe microscopy

Domain structure

Visualization of the domain structure of magnetic materials with a high spatial resolution (£ 50 nm) by scanning probe microscopy

Mechanical properties

Study of local mechanical surface properties (friction, stiffness) using scanning probe microscopy

Relief (probe microscopy)

Condensed-matter sample surface 3D-measurements of the linear dimensions of micro- and nanorelief structure elements by scanning probe microscopy with high spatial resolution

Scanning probe microscope SolverNano: determination of the three-dimensional topology and microrelief parameters of the condensed media surface. XY plane resolution down to 0.05 nm, Z plane resolution – down to 0.01 nm; XY sensor noise level of 0.3 nm, Z-sensor noise level of 0.03 nm; main techniques: contact AFM, amplitude modulation AFM, electrostatic AFM, magnetic AFM, AFM spectroscopy, STM techniques, nanolithography.

from 800

for a set of studies

Determination of the main parameters of surface roughness using scanning probe microscopy

Domain structure

Visualization of the domain structure of magnetic materials by scanning probe microscopy

Mechanical properties

Study of local mechanical surface properties (friction, stiffness) using scanning probe microscopy

Structure

Crystal lattice

Mechanical Strain

Establishment of type and parameters of the crystal lattice of inorganic and organic materials, the sizes of coherent scattering regions, the magnitude of internal mechanical strain of the 1st and 2nd kind, texture characteristics, etc. by X-ray diffraction analysis

Rigaku Ultima IV X-ray diffractometer: range of 2θ scanning angles from -3° to +162°; minimum scanning step along the angle of 0.0001°; Bragg-Brentano geometry, parallel beam; attachment for analysis of strain and pole figures in thin films and bulk samples; specialized high-temperature chamber for taking X-ray images when the sample is heated.

from 1 000

for a set of studies

Identification of polycrystalline substances, determination of crystallographic characteristics of individual compounds and solid solutions by X-ray phase analysis

Determination of the degree of crystallinity of a sample by X-ray diffractometry

Chemical composition

Elemental microanalysis of metals, alloys, objects of art and antiques, biological objects, natural samples; layer-by-layer elemental analysis with micron and submicron resolution of functional, protective and decorative coatings

Laser atomic emission spectrometer: determination of element concentration with a sensitivity of 10-2-10-3%; number of determined chemical elements: 50; spectral range: 190-800 nm; spectral resolution: 0.1 nm; minimum diameter of the laser beam on the sample surface: not more than 70 μm.

from 1 000

for a set of studies

Hardness

Determination of microhardness, dynamic hardness and nanohardness of materials

Shimadzu DUH-202 dynamic microhardness tester: Berkovich indenters, loading accuracy of 1% of the specified load, depth measurement accuracy of 1 nm, load value from 0.1 mN to 1961 mN, indentation depth of up to 10 μm

HV-1000, 402MVD microhardness testers: Vickers, Knoop indenters, load range from 0.1 to 9.8 N

HBRVU-187.5 universal hardness tester: determination of hardness by Rockwell, Brinell and Vickers methods (maximum load of 1471 N)

Measurements are carried out in accordance with GOST R 8.748-2011 (ISO 14577-1:2002).

from 1 000

for a set of studies

Elasticity

Determination of the elastic modulus by static and dynamic methods at room temperature

Friction (tribology)

Study of tribological properties of surfaces of various materials

UIPT-001 automated unit for studying friction processes in modified layers and thin coatings: provides reciprocating motion of the sample with a given amplitude and speed, while measuring the coefficient of friction between the indenter and the sample surface.

Range of possible sample sizes: minimal – 6×4×1 mm3; maximal – 20×35×8 mm3; indenter type – spherical, indenter curvature radius – from 0.75 mm to 3 mm; load on the indenter – from 0.01 N to 0.5 N; wear track length – from 5 mm to 20 mm.

The technique for studying the tribological properties of the surface of various materials and the subsequent saving on a digital medium of the ‘friction coefficient’-‘friction path’ dependence has been certified by BelGIM.

from 1 000

for a set of studies

Stretch / compression

Mechanical static tensile and compression tests

Testometric M250-10CT universal electromechanical testing machine (maximum load of 10 kN). Tests are carried out in accordance with GOST 1497-84 (ISO 6892-84, ST SEV 471-88), GOST 25.503-97.

from 1 000

for a set of studies

Metallography

Sample surface imaging and grain analysis using a metallographic microscope

MI-1 metallographic microscope (JSC Planar): magnification of ×50-×1000. Grain analysis methods are used in accordance with ASTM E 1382 - 97, E 930 - 92, ISO 643 and GOST 5639 - 82 standards.

from 1 000

for a set of studies

Thermal and thermoelectric properties, fluid dynamics

Thermoelectric properties

Measurement of thermoelectric material properties

Complex for research of thermoelectric properties of materials: determination of electrical conductivity, thermal conductivity, thermoelectric power, thermoelectric figure of merit for thermoelectric materials in the temperature range from room temperature up to 400 °C.

from 1 000

for a set of studies

Thermal conductivity / thermal resistance

Determination of thermophysical characteristics of enclosing structures and heat-insulating materials

TCMC thermal conductivity measurement facility for building and insulating materials: experimental determination of thermophysical characteristics of enclosing structures and thermal insulation materials. Thermal conductivity determination range of 0.002 – 1.0 W/(m·K); thermal resistance coefficient determination range of 0.1 – 8.0 (m2·K)/W; temperature measurement range of 0 – 40 °C; maximum heater temperature – 70 °С; pressure on the sample of 21 kPa.

from 800

for a set of studies

Simulations

Computational fluid dynamics and thermal physics

Problems of isothermal and non-isothermal flows, flows in pipelines. Atmospheric currents. Transfer of impurities with convection. Finite difference, finite volume (OpenFOAM) and finite element modeling. Thermal conductivity in solids.

from 2 000

for a set of calculations

Electrical, electronic, magnetic properties

Electrophysical and magnetic properties

Determination of electrophysical and magnetic properties of metal, semiconductor, composite materials and structures

CFHF electrophysical measurement complex: determined parameters and characteristics include resistance, I-V characteristics, Hall coefficient, magnetoresistance, thermo-EMF coefficient, thermal conductivity coefficient, magnetic moment in the temperature range of 1.7 – 300 K and magnetic fields up to 8 T. For resistance or I-V characteristic measurements, the temperature range can be extended up to 1200 K.

from 1 000

for a set of studies

Electrical properties

Measurement of electrical characteristics of semiconductor materials and structures under a controlled gas environment

Conductivity measurements using KEITHLEY 2450 source-meter, GDS 71102B digital oscilloscope, AKIP-3409/3A signal generator. It is possible to carry out measurements at various values of relative humidity (from 0 to 100%), as well as in vacuum, inert gases, liquid vapors with varying pressure.

from 1 000

for a set of studies

Energy storage (batteries)

Energy storage device electrical characteristic measurements

Measurement of cyclic volt-amperegrams and charge-discharge curves in the current range of 0-1 A and voltage range of 0-100 V

from 800

for a set of studies

Spectroscopy

Impedance spectroscopy of materials and liquids

Studies of the impedance of materials and structures in the frequency range of 20 Hz – 30 MHz in the temperature range of 10-300 K. Determination of the dielectric constant of solids and liquids.

from 1 000

for a set of studies

Cathodoluminescence spectroscopy

Registration of cathodoluminescence spectra of samples at a room temperature or liquid nitrogen temperature in an MDR-23 / FEU-100 monochromator-based setup, electron energy of 10 keV, spectral measurement range from 200 to 900 nm.

from 1 000

for a set of studies

Photoluminescence spectroscopy

Registration of photoluminescence spectra of samples at a room temperature or liquid nitrogen temperature in an MDR-23 monochromator based setup with a cooled Ge:Cu photoresistance, excitation by xenon lamp radiation, spectral measurement range of 1200-1600 nm

from 1 000

for a set of studies

Registration of photoluminescence excitation spectra of samples at a room temperature or liquid nitrogen temperature in an MDR-23 monochromator-based setup, excitation by xenon lamp radiation, spectral measurement range of 200–800 nm

from 1 000

for a set of studies

Electron paramagnetic resonance measurements

Varian and Radiopan EPR spectrometers: EPR measurements with an operating frequency of 9.3 GHz, a sensitivity of 1×1012 spin/mT. The range of changes in the magnetic field modulation frequency is from 1 to 100 kHz, the magnetic field sweep range is up to 1 T. Measurements at temperatures from 77 to 500 K.

from 1 000

for a set of studies

Simulations

Computational electrodynamics

Nanophotonics. Problems of propagation of electromagnetic radiation in photonic crystals, metamaterials. Time Domain Finite Difference Method (FDTD).

Nonlinear optics. Problems of the propagation of laser beams and pulses. Finite difference methods for wave equations.

from 2 000

for a set of calculations

Calculation of the electronic properties of semiconductor compounds with a unit cell size of not more than 20 atoms

Investigation of the band structure and distributions of electron densities with atomic and orbital contributions by first-principle methods in the generalized gradient approximation.

2 000

for a set of calculations

Optical properties

Transmission

Reflection

Optical density

Measurement of spectral characteristics of reflection, transmission and optical density in polarized light

Photon RT spectrophotometer: spectral measurement range: 190 - 3000 nm; spectral resolution: 190 - 1000 nm (600 lines/mm grating) - 1.8 nm, 1000 - 3000 nm (300 lines/mm gratings) - 3.6 nm, reflection coefficient measurement angles of 8 – 60°.

from 1 000

for a set of studies

Measurement of spectral characteristics of reflection, transmission and optical density in polarized light

MC 122 spectrophotometer: spectral range of 190-1100 nm; spectral resolution of 3 nm; minimum angle for work with reflected radiation – 20°.

from 800

for a set of studies

Measurement of transmission and optical density spectra

VERTEX 70 Fourier spectrometer:

spectral range of 400 – 10 000 cm-1,

spectral resolution of 0.5 cm-1.

from 1 000

for a set of studies

Measurement of transmission spectra

Registration of absorption spectra of samples at a room temperature or liquid nitrogen temperature in a setup based on an MDR-12 monochromator with S1336-SQ photodetector (Hamamatsu), spectral measurement range – 200-1100 nm.

from 1 000

for a set of studies

Holography

Measurement of the diffraction characteristics of holograms and diffractive optical elements

Hardware-software complex of digital diagnostics for an objective assessment of holographic element properties: objective quality control of diffractive optical elements and holographic elements used to protect securities and documents. Diffraction efficiency measurement range: 0.1 – 100%, period of controlled diffraction gratings: 0.5 – 3 µm, spatial resolution of the registration system: 70 µm.

from 1 000

for a set of studies

Optoelectronic properties

Spectroscopy

Photoconductivity spectroscopy

Registration of photoconductivity spectra of samples at temperatures from 20 to 300 °C in an MDR-12 monochromator based setup, excitation by a xenon lamp radiation, spectral measurement range - 200-800 nm.

from 1 000

for a set of studies

Measurement of photoconductivity, photocurrent and photoEMF spectra

MLS 35 Spectrometer: measurement of photoconductivity, photocurrent and photoEMF spectra of photosensitive materials and structures in the wavelength range of 190-1100 nm

from 1 000

for a set of studies

Radiation-matter interactions

X-rays

Calculation and interpretation of the processes of interaction of X-rays with matter

Wolfram Mathematica, C++: calculation of cross sections of processes and solving the kinetic equations

2 000 – 4 000

for a set of calculations

Theoretical substantiation of the parameters of X-ray sources with continuously variable frequency

Wolfram Mathematica, C++: analyzing the parameters of materials and accelerators for choosing the optimal source characteristics

from 2 000

for a set of calculations

Optical range

Calculation and interpretation of the processes of interaction of optical radiation with matter

Wolfram Mathematica, C++: calculation of cross sections of processes and solving the kinetic equations

2 000 – 4 000

for a set of calculations

Quantum optics

Description of object characteristics for quantum optics

Wolfram Mathematica, C++: calculating the characteristics of quantum emitters and receivers beyond perturbation theory

from 2 000

for a set of calculations

Biophysics and pharmaceuticals

Cell culture

Cultivation of cells of various lines

Used for laboratory diagnostics of viral infections, solving research problems in the field of medicine, cellular and molecular biology, biotechnology. The cultures are produced as a suspension (250-300 thousand cells/ml) in DMEM or MEM media containing 10% fetal bovine serum.

from 1 000 for

100 million cells

Pharmacological testing

Antitumor drug testing

Study of the effect of anticancer pharmacological drugs using cell test systems. The tests include a complex of biophysical studies (proliferative activity, vital activity, redox properties, membrane potential, calcium signaling) on two tumor cell line populations with a different antitumor agent resistance.

from 4 000

for a set of studies

Neurotropic drug testing

Study of the effect of neurotropic pharmacological drugs using cell and tissue test systems. The tests include a set of electrophysiological measurements on brain slices and using neurosensors containing 3D-printed biological neural networks.

from 4 000

for a set of studies

Anticoagulant drug testing

Study of the effect of anticoagulant pharmacological drugs using cellular test systems. The tests include a complex of biophysical studies (aggregation, functional activity, membrane potential, ion currents, calcium signaling) on human blood platelets.

from 4 000

for a set of studies

Anti-inflammatory drug testing

Study of the effect of anti-inflammatory pharmacological drugs using cellular test systems. The tests include a complex of biophysical studies (functional activity, netosis, exocytosis, calcium signaling) on human blood neutrophils.

from 4 000

for a set of studies

Molecular calculations

Analysis of internal rotation in molecules with multiple tops

Modeling of molecular system parameters using GAMESS and ORCA software packages; for large amplitudes, own developments in the Wolfram Mathematica environment are used; the parameters of diatomic molecules are calculated by multiconfiguration methods using the ActiveSpace kit.

1 000 – 4 000

for a set of calculations

Calculations of spectral and structural characteristics of complexes and clusters with hydrogen bonds

2 000 – 4 000

for a set of calculations

Calculations of the potential energy functions of the lower electronic states, as well as molecular spectroscopic constants and radiation characteristics of diatomic molecules for laser cooling

1 000 – 4 000

for a set of calculations

Synthesis

Films

Deposition of metal and semiconductor films

VUP-5, VUP-5M devices: resistive sputtering, magnetron sputtering, reactive magnetron sputtering.

from 1 000

for a set of samples

Coatings

Coating by magnetron and resistive methods

HHV Auto 500 automated vacuum unit for ion-plasma deposition of nanocomposite coatings and thin films: oil-free vacuum pumping system, providing a degree of vacuum in the process chamber of 5×10-7 Torr; two magnetron sources for direct and alternating current; process gas inlet system (argon, nitrogen); two resistive evaporators.

from 1 000

for a set of samples

3D printing

3D modeling and printing

3D printing using Prusa i3 3D Printer.

from 1 000

for a set of samples

Other services

Condition monitoring

Oil condition monitoring

The device for oil condition control (coaxial capacitor measuring cell, signal generator, microcontroller, LCD): both technical (motor, transformer, etc.) and vegetable (sunflower, olive, linseed, etc.) oils can be analyzed as the test samples. Measurements are carried out in the temperature range Tmeas of 20 – 120 °C. The minimum volume of the studied oil Vmin = 150 ml.

from 1 000

for a set of studies